GOST 9853.23-96
GOST 9853.23−96 Titan spongy. Spectral method for determination of silicon, iron, Nickel
GOST 9853.23−96
Group B59
INTERSTATE STANDARD
TITANIUM SPONGE
Spectral method for determination of silicon, iron, Nickel
Sponge titanium. Spectral method for determination of silicon, iron, nickel
ISS 77.120*
AXTU 1709
_________________________________
* In the index «National standards», 2008
OKS 77.120, 77.120.50 — note the manufacturer’s database.
Date of introduction 2000−07−01
Preface
1 DEVELOPED by the Interstate technical Committee for standardization MTK 105, Ukrainian research and design Institute of titanium
SUBMITTED to the State Committee of Ukraine for standardization, Metrology and certification
2 ADOPTED by the Interstate Council for standardization, Metrology and certification (Protocol No. 9 dated April 12, 1996)
The adoption voted:
The name of the state | The name of the national authority for standardization |
The Republic Of Azerbaijan |
Azgosstandart |
The Republic Of Belarus |
Gosstandart Of Belarus |
The Republic Of Kazakhstan |
Gosstandart Of The Republic Of Kazakhstan |
Russian Federation |
Gosstandart Of Russia |
Turkmenistan |
The main state inspection of Turkmenistan |
Ukraine |
Gosstandart Of Ukraine |
3 Resolution of the State Committee of the Russian Federation for standardization and Metrology dated 19 October 1999 No. 353-St inter-state standard GOST 9853.23−96 introduced directly as state standard of the Russian Federation from July 1, 2000.
4 REPLACE GOST 9853.6−79
1 Scope
This standard specifies the spectral method for determination of silicon, iron and Nickel in sponge titanium according to GOST 17746.
The method is based on excitation of atoms of titanium and silicon atoms, iron, Nickel in an arc discharge or high frequency induction plasma, decomposition of the radiation into a spectrum, photographic or photoelectric registration of analytical signals proportional to the intensity or the logarithm of the intensity of spectral lines and subsequent determination of the mass fraction of silicon, iron, Nickel in the sample by using the calibration parameters.
The method allows to determine the mass fraction of elements:
silicon | from | 0,002% | to | 0,10% |
||
iron | « | 0,01% | « | 0,50% | ||
Nickel | « | 0,01% | « | 0,20% |
2 Normative references
The present standard features references to the following standards:
GOST 83−79 Sodium carbonate. Specifications
GOST 195−77 Sodium sanitarily. Specifications
GOST 244−76 Sodium thiosulfate crystal. Specifications
GOST 1770−74 laboratory Glassware measuring glass. Cylinders, beakers, flasks, test tubes. Specifications
GOST 2789−73 surface Roughness. Parameters and characteristics
GOST 4160−74 Potassium bromide. Specifications
GOST 6709−72 distilled Water. Specifications
GOST 9853.2−96 Titan spongy. Method for determination of iron
GOST 9853.9−96 Titan spongy. Method for determination of silicon
GOST 9853.22−96 Titan spongy. Methods for determination of Nickel
GOST 10157−79 Argon gaseous and liquid. Specifications
GOST 14261−77 hydrochloric Acid of high purity. Specifications
GOST 17746−96 spongy Titanium. Specifications
GOST 18300−87 ethyl rectified technical. Specifications
GOST 19627−74 Hydroquinone (paradoxians). Specifications
GOST 23780−96 spongy Titanium. Methods of sampling and sample preparation
GOST 25086−87 non-ferrous metals and their alloys. General requirements for methods of analysis
GOST 25664−83 Metol (4-methylaminophenol sulfate). Specifications
GOST 28498−90 Thermometers liquid-in-glass. General technical requirements. Test methods
GOST 29298−92* cotton and mixed household. General specifications
________________
* On the territory of the Russian Federation GOST 29298−2005, here and hereafter. — Note the manufacturer’s database.
3 General requirements
3.1 General requirements for the method of analysis according to GOST 25086.
3.2 Selection and preparation of samples is carried out according to GOST 23780.
3.3 the result of the analysis taking the arithmetic average of the results of the two definitions.
3.4 To construct the calibration graphs using standard samples. Each point of calibration curve is based on the average of the results of the two measurements.
4 measuring instruments and auxiliary devices
4.1 General purpose
Lathe type TV-16 or similar machines.
The lathe.
Set of standard samples of a defined range of element contents, covering the limits of element contents in titanium (like GSO U1−92-Y6−92 on the register of state standard of Ukraine or N 6493−92−6498−92 on the register of Gosstandart of Russia).
Laboratory measuring glassware (cylinders, beakers, flasks) according GOST 1770.
Ethanol (ethyl alcohol) rectified technical GOST 18300.
Calico, Batiste GOST 29298.
4.2 excitation spectrum in the arc discharge
The quartz spectrograph medium dispersion type of ISP-30 or similar devices.
The installation of a photovoltaic type DFS-36 or MF-8, or similar devices.
Arc generator variable type, UGE-4, or IVS-28 or similar devices.
Microphotometer type MF-2 or IPV-460 or similar devices.
Spectromancer of PS-18 and MMP-2 or similar devices.
Installation for sharpening of spectral coals.
Coals spectral brand OS.h. 7−3 or OS.h. 7−4 with a diameter of 6 mm according to the current normative document.
Spectrographic plates of types I, S, UPS, SFC-01, the SFC-02, the SFC-03 according to the current normative document or plates of any type, ensure the normal blackening of analytical lines.
Fotocity or other vessels for processing photographic plates.
Thermometer laboratory according to GOST 28498.
Developer.
Solution A:
— distilled water according to GOST 6709 — up to 1000 cm;
— metol according to GOST 25664 — 1 g;
— sodium sulfite (sodium sanitarily) anhydrous GOST 195 — 26 g;
— hydroquinone according to GOST 19627 — 5 g.
Solution B:
— distilled water according to GOST 6709 — up to 1000 cm;
— sodium carbonate (sodium carbonate) anhydrous GOST 83 — 20 g;
— potassium bromide (potassium bromide) according to GOST 4160 — 1,
Before the manifestation of the solutions A and B mixed in a volume ratio of 1:1.
Fixer:
— distilled water according to GOST 6709 — up to 1000 cm;
— sodium thiosulfate GOST 244 — 300 g;
— sodium sulfite (sodium sanitarily) anhydrous GOST 195 — 26 g.
Allowed the use of developer and fixer of other compositions which do not deteriorate the quality of the photographic registration of the spectrum.
4.3 excitation spectrum in a high frequency induction plasma
Plasma spectrometer PS-4 firms BAIRD (Netherlands) or similar devices.
Argon according to GOST 10157.
Hydrochloric acid OS.h. according to GOST 14261, diluted 1:1.
The standard solutions of the determined elements.
5 preparation for measurement
5.1 excitation spectrum in the arc discharge
For analysis taking the cast samples prepared for mechanical testing.
Effects of arc discharge is subjected to a flat end or lateral surface of the samples and standard samples.
The analyzed surface is carefully treated with a finishing cutter on a lathe with a roughness of the processed surface is not more than 2.5 µm according to GOST 2789, sharp edges removed (chamfer) and wiped with coarse calico moistened with ethanol. On the surface of samples is not allowed sinks, cracks, nonmetallic inclusions and other defects.
Standard samples with a diameter of 20 mm, a length of 50−100 mm are prepared for analysis in the same way as the analyzed samples.
Spectral coal — rods with a diameter of 6 mm, used as protivoelektrodom should be sharpened to a truncated cone with apex angle 60°±3°. The apex of the cone must be cut at the plane perpendicular to the axis of the rod so as to form a platform with a diameter of (1,0±0,1) mm.
5.2 excitation spectrum in a high frequency induction plasma
A portion of titanium sponge mass 1.0 g is placed in a conical flask with a capacity of 100 cm, 70 cm pouredhydrochloric acid diluted 1:1 and dissolved by heating. The solution was then cooled, transferred to a volumetric flask with a capacity of 100 cmand adjusted to the mark with water.
Preparation of solutions of standard samples of titanium is carried out in the same way as the analyzed samples.
6 procedures for measuring
6.1 in the excitation spectrum in the arc discharge
6.1.1 With photographic registration of spectrum measurements on the spectrograph produced in the coverage gap are being, or single-lens condenser with fully open intermediate diaphragm.
For the excitation spectrum of titanium atoms and silicon atoms, iron and Nickel used arc AC discharge parameters: current — 6,0−10,0 A, pre-firing (10±1) s, the exposure time is adjusted depending on the sensitivity of photographic plates. The blackening of analytical lines should be in the region of the rectilinear part of the characteristic curve of photographic plates.
The analytical gap is the distance between the surface sample and coal cone of the counter — must be 1,5−2,0 mm.
The gap is measured by template, by the method of shadow projection or on the measuring scale of the indicating drum.
Not allowed aperturing of the light source the edges of the sample, the rims of the parts of the condenser or of a spectrograph.
On the same photographic plate photographed in the same conditions as the standard samples and the samples not less than twice.
6.1.2 by the photoelectric registration of spectrum
The measurements were carried out using the excitation spectrum of titanium atoms and silicon atoms, iron and Nickel arc AC discharge parameters: current — a 4.0 a 6.0 a; voltage — (220±10) V; phase of the arson — 90°; repetition frequency discharges — 100 imp/s; bit inductance — 10 uh; the roasting time 0; time of exposure 50 p. Analytic in the interelectrode gap of 1.5−2.0 mm is set on the measuring scale of the indicating drum or pattern.
6.2 excitation spectrum in a high frequency induction plasma
Measurements on the plasma spectrometer is carried out under the following conditions of excitation and registration of the spectrum: the generator output to 1.2−1.3 kW; the integration time is 3 s; number of integration, 5; height of observation above the rim of the quartz burner is 16 mm; the feed rate of the sample peristaltic pump — 4 cm/min; the pressure of argon carrying the aerosol — 235 kPa; argon flow carrying the aerosol — 1,1 DM/min, plasma — 1,1 DM/min, cooling — 13,0 DM/min.
6.3 permitted the use of other devices, equipment, materials, modes of excitation and registration of spectrum subject to receipt of the metrological characteristics meet the requirements of this standard.
7 Processing measurement results
7.1 the Mass fraction of silicon, iron and Nickel when working on the define spectrograph, spectrogram fotometriya on microphotometer.
As internal standard used the line titanium 243,83 nm.
Use the following analytical lines of elements (wavelength, nm):
silicon | from | 0,002% | to | A 0.02% 251,43, |
||
St. | 0,02% | « | 0,10% — 243,51, | |||
iron | from | 0,01% | « | 0,10% — 238,20, | ||
St. | 0,10% | « | 0,50% — 248,41, | |||
Nickel | from | 0,01% | « | A 0.05% to 232.00, | ||
St. | 0.05% of | « | 0,20% — 231,23. |
In each spectrogram, measure the blackening of analytical pairs of spectral lines and calculate the difference of pochernenija analytical line of the element and the line of comparison.
Obtained for each standard sample values is calculated the average difference pucherani . The calibration graphs are built in coordinates , where — mass fraction of silicon, iron and Nickel, indicated in the certificate for the standard sample; — the average value of the difference pucherani analytical lines and comparison lines.
The abscissa shows the delay values and the y — axis corresponding values .
In the constructed calibration chart find the mass percent of the designated element
s.
7.2 the Mass fraction of silicon, iron and Nickel when working on the photovoltaic installation with the excitation spectrum in the arc discharge determined by building calibration charts in the coordinates or where the readings of the output of the measuring device.
Use the following analytical lines of elements (wavelength, nm):
silicon — 288,16,
iron — 238,20,
Nickel — 341,48.
As internal standard used the line titanium 294,83 nm.
7.3 the Mass fraction of silicon, iron and Nickel when working on the plasma spectrometer is determined by building calibration graphs in the coordinate
, (1)
— mean value of intensity of analytical lines in the comparison solution or solution of standard sample;
— the intensity of the analytical lines in the solution of titanium of high purity (the content of the analyzed element is not more than the lower limit of determination).
Use the following analytical lines of elements (wavelength, nm):
silicon — 251,61,
iron — 259,94,
Nickel — 231,60.
7.4 the use of other analytical lines and coordinate systems subject to obtaining the metrological characteristics meet the requirements of this standard.
8 Allowable measurement uncertainty
8.1 the Difference between the two definitions and the results of two tests performed in different conditions, should not exceed (with confidence probability of 0.95) of the values specified in table 1. The error analysis results (at a confidence probability of 0.95) does not exceed the limit given in table 1.
Table 1
Percentage
The designated element | Mass fraction | The permissible divergence | The margin of error of measurement | |||||
Silicon |
From | 0,0020 | to | 0,0050 | incl. | 0,0015 | 0,0020 | 0.0016 inch |
SV. | 0,005 | « | 0,010 | « | 0,003 | 0,004 | 0,003 | |
« | 0,010 | « | 0,020 | « | 0,005 | 0,007 | 0,006 | |
« | 0,020 | « | 0,050 | « | 0,010 | 0,012 | 0,010 | |
« | 0,050 | « | 0,100 | « | 0,020 | 0,025 | 0,020 | |
Iron |
From | 0,010 | « | 0,020 | « | 0,005 | 0,007 | 0,006 |
SV. | 0,020 | « | 0,050 | « | 0,010 | 0,015 | 0,012 | |
« | 0,050 | « | 0,100 | « | 0,015 | 0,020 | 0,016 | |
« | 0,10 | « | 0,20 | « | 0,03 | 0,04 | 0,03 | |
« | 0,20 | « | 0,50 | « | 0,06 | 0,07 | 0,06 | |
Nickel |
From | 0,010 | « | 0,020 | « | 0,006 | 0,007 | 0,006 |
SV. | 0,020 | « | 0,050 | « | 0,010 | 0,012 | 0,010 | |
« | 0,050 | « | 0,100 | « | 0,020 | 0,025 | 0,020 | |
« | 0,10 | « | 0,20 | « | 0,03 | 0,04 | 0,03 |
8.2 Control the accuracy of the results of spectral analysis carried out by comparing the obtained results with the results of the analysis carried out by chemical method according to GOST 9853.2, 9853.9 GOST, GOST 9853.22 at least once a quarter.
The number of results of spectral analysis, controlled by chemical analysis, establish depending on the total number of incoming samples, but not less than 0.1% of all samples of commercial products coming into the lab for the quarter.
The accuracy of the analysis results shall be considered satisfactory if not less than 95% of cases the condition
, (2)
where the result of analysis of control samples obtained by the present method;
— the result of the analysis of the same samples obtained by the chemical method;
and — the permissible discrepancy between the results of the analyses for respectively the spectral and chemical methods.
8.3 Operational control of accuracy of analysis results is carried out before the beginning of the shift or at the same time analysis of batch production samples.
For control purposes, choose the standard two sample values of the mass fraction of the element located in the lower and upper limits of the measurement range, and perform measurements of the content of this element in each standard sample. If at least one standard sample analysis result at the operational control differs from the value of the mass fraction of the element at a given point of the calibration characteristics is more than 0.5, adjust the calibration characteristics.
9 qualifications
To perform analysis allowed spectroscopist qualification not less than 4th category, having II qualifying group with electrical.